• DocumentCode
    1068825
  • Title

    Super low-noise GaAs MESFET´s with a deep-recess structure

  • Author

    Ohata, Keiichi ; Itoh, Hitoshi ; Hasegawa, Fumio ; Fujiki, Yoshinori

  • Author_Institution
    Nippon Electric Company, Ltd., Kawasaki, Japan
  • Volume
    27
  • Issue
    6
  • fYear
    1980
  • fDate
    6/1/1980 12:00:00 AM
  • Firstpage
    1029
  • Lastpage
    1034
  • Abstract
    Super low-noise GaAs MESFET\´s for replacement of parametric amplifiers have been successfully developed by adopting a deep-recess structure. The structure of a 0.5-µm gate in a deeply recessed region with a cylindrical edge shape has enabled reduction of the source resistance to a half of that of conventional flat-type MESFET\´s. The noise figure was improved by more than 0.5 dB by this reduction of the source resistance, and less than 2.0-dB noise figure has been reproducibly obtained at 12 GHz. The best noise figures were 0.7 dB (14.9-dB gain) at 4 GHz and 1.68 dB (10.7-dB gain) at 12 GHz. The developed MESFET\´s were applied to two-stage amplifiers of 11.7-12.2-GHz band, and the noise figure obtained was 2.16 dB ( T_{e}: 185 K) at room temperature and 1.94 dB ( T_{e}: 163 K) at 0°C. This performance is good enough to replace some of parametic amplifiers.
  • Keywords
    Gain; Gallium arsenide; Low-noise amplifiers; MESFETs; Noise figure; Satellite communication; Shape; Surface resistance; Tellurium; Temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.19982
  • Filename
    1480775