DocumentCode
1068825
Title
Super low-noise GaAs MESFET´s with a deep-recess structure
Author
Ohata, Keiichi ; Itoh, Hitoshi ; Hasegawa, Fumio ; Fujiki, Yoshinori
Author_Institution
Nippon Electric Company, Ltd., Kawasaki, Japan
Volume
27
Issue
6
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
1029
Lastpage
1034
Abstract
Super low-noise GaAs MESFET\´s for replacement of parametric amplifiers have been successfully developed by adopting a deep-recess structure. The structure of a 0.5-µm gate in a deeply recessed region with a cylindrical edge shape has enabled reduction of the source resistance to a half of that of conventional flat-type MESFET\´s. The noise figure was improved by more than 0.5 dB by this reduction of the source resistance, and less than 2.0-dB noise figure has been reproducibly obtained at 12 GHz. The best noise figures were 0.7 dB (14.9-dB gain) at 4 GHz and 1.68 dB (10.7-dB gain) at 12 GHz. The developed MESFET\´s were applied to two-stage amplifiers of 11.7-12.2-GHz band, and the noise figure obtained was 2.16 dB (
K) at room temperature and 1.94 dB (
K) at 0°C. This performance is good enough to replace some of parametic amplifiers.
K) at room temperature and 1.94 dB (
K) at 0°C. This performance is good enough to replace some of parametic amplifiers.Keywords
Gain; Gallium arsenide; Low-noise amplifiers; MESFETs; Noise figure; Satellite communication; Shape; Surface resistance; Tellurium; Temperature;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.19982
Filename
1480775
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