DocumentCode :
1069050
Title :
Operating Property Analysis of Parallelized Resistive Fault Current Limiter Using YBCO Thin Films
Author :
Noguchi, So ; Tanikawa, Takanori ; Igarashi, Hajime
Author_Institution :
Hokkaido Univ., Hokkaido
Volume :
17
Issue :
2
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
1835
Lastpage :
1838
Abstract :
The resistive superconducting fault current limiters are very attractive devices for electric power circuits. We have investigated the operating properties of a parallelized superconducting fault current limiter made from YBCO thin film and gold film on sapphire substrate by numerical simulation. In order to improve the operating properties and the stability, the YBCO films need to be parallelized. However, it is necessary to investigate whether a few sheets of YBCO film with different critical current density will deteriorate the device´s operating properties and stability. That is, when the fault current occurs in power circuit, all YBCO films with different critical current density have not simultaneously quenched. It causes the deterioration of the operating properties. Therefore, it is necessary to investigate the influence of the unbalanced critical current density on the quench characteristics of the parallelized superconducting fault current limiter by numerical simulation. The simulation is performed by a newly developed code coupling the thermal diffusion and the current circuit. It takes into account the E-J power low depending temperature, obtained by experiments. The current limiting properties and the recovery properties are evaluated from quench behavior when the YBCO films have some inhomogeneities. Moreover, the influence of the thickness of gold film on the current limiting properties is also investigated. To grasp such properties is required when the resistive fault current limiter using YBCO thin film is designed.
Keywords :
barium compounds; critical current density (superconductivity); fault current limiters; gold; high-temperature superconductors; sapphire; superconducting devices; superconducting thin films; thermal diffusion; yttrium compounds; Al2O3 - Surface; Au - Interface; E-J power; YBCO thin films; YBa2Cu3O7 - Interface; code coupling; critical current density; current limiting properties; gold film; parallelized resistive fault current limiter; power circuit; resistive superconducting fault current limiters; sapphire substrate; thermal diffusion; Circuit stability; Critical current density; Fault current limiters; Gold; Numerical simulation; Superconducting films; Superconducting thin films; Thin film circuits; Transistors; Yttrium barium copper oxide; Numerical analysis; YBCO thin film; parallelized resistive superconducting fault current limiter;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.898534
Filename :
4277633
Link To Document :
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