Title : 
Kerr Type Electro - Optic Effect in Solid Dielectrics
         
        
            Author : 
Cooper, David E. ; Cheng, T.C. ; Kim, K.S. ; Kantak, Kiran
         
        
            Author_Institution : 
Southern California Edison Co. Rosemead, California
         
        
        
        
            fDate : 
6/1/1980 12:00:00 AM
         
        
        
        
            Abstract : 
Electrically induced optical birefringence having a second power field dependence (Kerr effect) has been identified in common amorphous, transparent, dielectric materials such as PMMA, polyethylene, and cross-linked polyethylene. Using a He-Ne laser the relative phase retardation of light passing through an electrically stressed sample placed between crossed polarizers has been measured. An electrooptical coefficient of less than 0.1% of the Kerr coefficient in nitrobenzene has beenter-determined for PMMA samples. Even smaller values have been measured for PE samples. The measurements in PE are made for a range of temperatures in which the materials are transparent to visible light.ntri-Contributions from Maxwell stress towards the total observed effect have been determined independently. The measurement of substantial Kerr-type effect in PE is particularly significant as it makes possible a non-destructive technique of mapping electric fields around voids and inclusions within such polymeric insulation.
         
        
            Keywords : 
Amorphous materials; Birefringence; Dielectric materials; Electric variables measurement; Kerr effect; Lasers and electrooptics; Nonlinear optics; Polyethylene; Solids; Stress measurement;
         
        
        
            Journal_Title : 
Electrical Insulation, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TEI.1980.298322