Title :
Thermally Stimulated Characteristics in Solid Dielectrics
Author_Institution :
Tokyo Institute of Technology
fDate :
6/1/1980 12:00:00 AM
Keywords :
Charge measurement; Cooling; Current measurement; Dielectric measurements; Electron traps; Polarization; Solids; Temperature; Time measurement; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1980.298323
