Title :
Microstructure and n-value of RHQT processed Nb3Al superconductors for NMR uses
Author :
Takeuchi, T. ; Banno, N. ; Tagawa, K. ; Kobayashi, T. ; Tsuchiya, K. ; Tatsumi, N. ; Kitaguchi, H. ; Fukuzaki, T. ; Kosuge, M. ; Wada, H. ; Iijima, Y. ; Kikuchi, A. ; Inoue, K.
Author_Institution :
National Inst. for Mater. Sci., Tsukuba, Japan
fDate :
6/1/2004 12:00:00 AM
Abstract :
We have examined the critical current Ic and n-values of RHQT processed Nb3Al conductors at 4.2 K in a wide range of fields from 14.5 to 25 T in relation to the microstructures obtained. For a point and a tail of Cu-clad rectangular conductor used for a winding, the n-values were determined by fitting the voltage over a taps spacing of 110 or 220 mm to a relationship of V = CIn, in a range from 10-5 to 10-4 V/m. Such n-values were almost the same with each other, indicating the uniformity of a 370 m length of RHQT Nb3Al conductor as the Ic consistency does. The n-value increased monotonously with decreasing a field from 25 T to 18 T, but got saturated to be around 35 at 4.2 K in fields less than 18 T. The n-value at 21 T and 4.2 K, corresponding to 23.5 T and 1.8 K, was about 25, and confirmed to be large enough for NMR uses.
Keywords :
aluminium alloys; copper; critical current density (superconductivity); crystal microstructure; deformation; magnetic fields; niobium alloys; nuclear magnetic resonance; quenching (thermal); superconducting magnets; type II superconductors; 1.8 K; 14.5 to 25 T; 21 T; 23.5 T; 25 to 18 T; 4.2 K; Cu; Cu-clad rectangular conductor; NMR; Nb3Al; Nb3Al superconductors; RHQ condition; RHQT process; critical current; deformation; microstructure; n-value; persistent-mode magnet; stabilization; voltage fitting; Conductors; Critical current; Magnetic resonance; Materials science and technology; Microstructure; Niobium; Nuclear magnetic resonance; Superconducting magnets; Superconductivity; Voltage; Deformation; RHQ condition; persistent-mode magnet; stabilization;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2004.830339