• DocumentCode
    1069623
  • Title

    Preparation and magnetic properties of strontium ferrite thin films

  • Author

    Acharya, B. Ramamurthy ; Venkatramani, N. ; Prasad, Shiva ; Shringi, S.N. ; Krishnan, R. ; Tessier, M. ; Dumond, Y.

  • Author_Institution
    Indian Inst. of Technol., Bombay, India
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3370
  • Lastpage
    3372
  • Abstract
    Strontium ferrite films were deposited by RF sputtering of a commercial strontium ferrite target onto fused quartz substrates maintained at temperatures up to 900°C. Films deposited at T<800°C were amorphous, but films deposited at T>800°C had crystalline M-type strontium ferrite structures. The thin composition corresponded to that of the target. Films deposited at 800°C were partially oriented in the [110] direction with the c-axis in the plane. Postannealing led to an increase in the magnetization, indicating incomplete formation of ferrite in the as-deposited state. Both in-plane and perpendicular hysteresis loops are rectangular with remanence ratios of 0.8 and 0.6, respectively, showing partial orientation with the c-axis. The torque curve is consistent with the above, although there are some additional anomalous peaks
  • Keywords
    annealing; ferrimagnetic properties of substances; ferrites; magnetic hysteresis; magnetic thin films; remanence; sputter deposition; sputtered coatings; strontium compounds; 800 to 900 degC; SiO2; SrFe12O19 thin films; c-axis; crystalline SrFe12O19 structures; direction; fused quartz substrates; magnetic properties; magnetization; partial orientation; perpendicular hysteresis loops; plane; postannealing; preparation; radiofrequency sputtering; rectangular; remanence ratios; thin composition; torque curve; Amorphous materials; Crystallization; Ferrite films; Magnetic films; Magnetic properties; Magnetization; Radio frequency; Sputtering; Strontium; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.280818
  • Filename
    280818