DocumentCode
1069638
Title
A New Fabrication and Assembly Process for Ultrathin Chips
Author
Burghartz, Joachim N. ; Appel, Wolfgang ; Rempp, Horst D. ; Zimmermann, Martin
Author_Institution
Inst. for Microelectron. Stuttgart (IMS CHIPS), Stuttgart
Volume
56
Issue
2
fYear
2009
Firstpage
321
Lastpage
327
Abstract
A new ultrathin chip fabrication and assembly process, consisting of a preprocess module Chipfilm and a postprocess module Pick, Crack, and Place, is presented. In contrast to the established wafer thinning technique, the preprocessed wafer substrates are prepared with extremely narrow buried cavities beneath the chip areas at a well-defined distance from the wafer surface, thus precisely defining the chip thickness a priori. After CMOS integration on those dedicated wafer substrates, chips are detached from the wafer surface by etching trenches at the chip edges into the buried cavities and breaking of residual anchors by mechanical force in the postprocess. The feasibility of the new process is demonstrated through a mixed-signal circuit having 38 000 digital and 2700 analog transistors, showing full functionality within specifications for 20-mum-thin chips even under a bending stress of up to 110 MPa.
Keywords
CMOS analogue integrated circuits; CMOS digital integrated circuits; integrated circuit manufacture; microassembling; mixed analogue-digital integrated circuits; semiconductor industry; CMOS integration; Chipfllm; analog transistors; assembly; bending stress; buried cavities; digital transistors; fabrication; mechanical force; mixed-signal circuit; post-process module; preprocess module; residual anchor breaking; ultrathin chip; wafer thinning; Assembly; CMOS integrated circuits; CMOS technology; Etching; Fabrication; Integrated circuit technology; Microelectronics; Silicon; Substrates; Three-dimensional integrated circuits; CMOS FETs; CMOS integrated circuits (ICs); Cavities; IC fabrication; conductivity; electric field effects; electrochemical processes; electronics; electrostatic processes; etching; flexible structures; manipulators; microassembly; micromachining; semiconductor device doping; semiconductor device manufacture; semiconductor epitaxial layers; separation; silicon; stress; technology;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2010581
Filename
4752724
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