Strain-engineered magnetic phenomena in MnSe/ZnSe, MnTe/ZnTe, and MnSe/ZnTe superlattices

Author

Giebultowicz, T.M. ; Luo, Hong ; Samarth, Nitin ; Furdyna, J.K. ; Rhyne, J.J.

Author_Institution

Notre Dame Univ., IN, USA

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

3382

Lastpage

3387

Abstract

The authors point out that new zinc-blende structural modifications of MnSe and MnTe grown by molecular beam epitaxy offer unique examples of strongly frustrated FCC Heisenberg antiferromagnets. These systems can be obtained either in the form of strained superlattices with significant strain-induced anisotropy in the Mn-Mn exchange, or of nearly isotropic semi-bulk MnTe single films. Neutron diffraction studies show that the strain changes the phase transition order and the domain structure normally seen in unstrained lattices, and in some cases (MnSe/ZnTe superlattices) even produces a transition to an entirely new incommensurate helical spin structure

Keywords

II-VI semiconductors; antiferromagnetic properties of substances; induced anisotropy (magnetic); internal stresses; manganese compounds; molecular beam epitaxial growth; neutron diffraction examination of materials; semiconductor growth; semiconductor superlattices; zinc compounds; Mn-Mn exchange; MnSe-ZnSe superlattices; MnSe-ZnTe superlattices; MnTe-ZnTe superlattices; domain structure; incommensurate helical spin structure; isotropic semi-bulk MnTe single films; molecular beam epitaxy; neutron diffraction; phase transition order; strain engineered magnetic phenomena; strain-induced anisotropy; strained superlattices; strongly frustrated FCC Heisenberg antiferromagnets; zinc-blende structural modifications; Anisotropic magnetoresistance; Antiferromagnetic materials; Diffraction; FCC; Magnetic anisotropy; Magnetic superlattices; Molecular beam epitaxial growth; Neutrons; Perpendicular magnetic anisotropy; Zinc compounds;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.280822

Filename

280822