DocumentCode :
1069698
Title :
Investigation on Ic(B, T), Hc2(T), and microstructure of internal-tin Nb3Sn wires
Author :
Pantsyrnyi, Victor I. ; Shikov, Alexander K. ; Vorobieva, Alexandra E. ; Kozlenkova, Nina I. ; Soudiev, Sergey V. ; Mitin, Andrew E. ; Sergeev, Vladimir V. ; Mareev, Konstantin A.
Author_Institution :
Bochvar Res. Inst. of Inorg. Mater., Moscow, Russia
Volume :
14
Issue :
2
fYear :
2004
fDate :
6/1/2004 12:00:00 AM
Firstpage :
1000
Lastpage :
1003
Abstract :
The magnetic field (in range 5-12 T) and temperature dependencies (in range 4.2-12 K) of the transport current density Jc(B, T) and temperature dependence of upper critical field Bc2(T) in internal-tin multifilamentary wires are presented. The Summers relations have been applied for evaluation of the experimental Jc(T) and Bc2(T) data. The fitting parameters C, Tcm(0), and Bc2m(0) has been defined as giving the best fit to the experimental data. The microstructure of Nb3Sn filaments has been investigated by SEM. The particular features of the diffusion processes in internal tin wires lead to formation of the specific Nb3Sn filaments microstructure associated with high critical current density which have been analyzed.
Keywords :
critical current density (superconductivity); crystal microstructure; multifilamentary superconductors; niobium alloys; scanning electron microscopy; superconducting critical field; tin alloys; type II superconductors; 4.2 to 12 K; 5 to 12 T; Hc2; Ic; Jc; Nb3Sn; Nb3Sn filaments; Nb3Sn wires; SEM; Summers relations; critical current density; diffusion process; internal-tin wires; magnetic field; microstructure; multifilamentary wires; temperature dependencies; transport current density; upper critical field; Critical current density; Current density; Diffusion processes; Magnetic fields; Microstructure; Niobium; Temperature dependence; Temperature distribution; Tin; Wires; $rm Nb_; Critical current; rm Sn$ ; upper critical field; wire;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2004.830366
Filename :
1324962
Link To Document :
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