DocumentCode
1069754
Title
Enhancing the Energy Resolution of a Singles Photon STJ Spectrometer Using Diffusion Engineering
Author
Savu, Veronica ; Frunzio, Luigi ; Prober, Daniel E.
Author_Institution
Yale Univ., New Haven
Volume
17
Issue
2
fYear
2007
fDate
6/1/2007 12:00:00 AM
Firstpage
324
Lastpage
327
Abstract
Diffusion engineering has been proposed as an approach to increase the collected charge and energy resolution of a single-photon superconducting tunnel junction (STJ) spectrometer. We present new experimental results confirming this approach. When a photon of energy E is absorbed in a superconductor with energy gap Delta, it creates N initial quasiparticles, with N ap 0.6(E/Delta). Their charge, upon tunneling, is equal to Q = peN, with p = 1 for single tunneling across the voltage biased STJ. The output charge can be amplified by backtunneling, with p > 1,if the quasiparticles are confined around the junction. This charge multiplication is proportional to the confinement time. Previous work used higher gap superconductors for confinement. In this work, the counterelectrode is terminated by a long, narrow wire made of the same material. We find p > 1 due to the slow out-diffusion of the quasiparticles down the wire. The wire dimensions and diffusion constant were chosen to engineer the backtunneling multiplication. For large backtunneling, the signal-to-noise of our spectrometer is increased.
Keywords
semiconductor counters; spectrometers; superconductive tunnelling; backtunneling multiplication; charge multiplication; charge-energy resolution; diffusion constant; diffusion engineering; energy gap; energy resolution; signal-to-noise; single-photon STJ spectrometer; superconducting tunnel junction; Energy resolution; Josephson junctions; Power engineering and energy; Spectroscopy; Superconducting device noise; Superconducting epitaxial layers; Superconducting filaments and wires; Superconducting materials; Tunneling; Voltage; Backtunneling; optical spectrometer; single photon detector; superconducting tunnel junctions;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2007.898612
Filename
4277697
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