Title :
High-speed MOS gate array
Author :
Nakaya, Masao ; Tomisawa, Osamu ; Ohkura, Isao ; Nakano, Takao
Author_Institution :
Mitsubishi Electric Corporation, Itami, Hyogo, Japan
fDate :
8/1/1980 12:00:00 AM
Abstract :
The dimensions of the fundamental gate cell were analyzed in the gate-array type masterslice LSI which utilized the DSA MOS process combined with two-level metallization technology. It was revealed that the optimum gate width was 80 µm in the 4-µm design rule, taking the total power dissipation of 3 W and the delay time below 2 ns into consideration. The delay times were measured from both the original design chip and the 80-percent linearly shrunk chips. In the shrunk chip operated at a 3-V lower supply, the average gate delay time of 1.5 ns was obtained at a lower dissipation of 1.2 mW/gate which gave three times better performance than the original design chip at 5-V power supply.
Keywords :
Capacitance; Delay effects; Driver circuits; Integrated circuit interconnections; Large scale integration; Logic; Metallization; Power dissipation; Power supplies; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20085