• DocumentCode
    1069932
  • Title

    A large area TDI image sensor for low light level imaging

  • Author

    Farrier, Michael G. ; Dyck, Rudolph H.

  • Author_Institution
    Fairchild Camera and Instrument Corporation, Palo Alto, CA
  • Volume
    27
  • Issue
    8
  • fYear
    1980
  • fDate
    8/1/1980 12:00:00 AM
  • Firstpage
    1688
  • Lastpage
    1693
  • Abstract
    A 1030 × 128 element time delay and integration (TDI) CCD image sensor has been developed for low-light-level (L3) imaging applications. For L3imaging, output is derived from a high-gain low-noise floating-gate amplifier (FGA). For larger input signal levels, a second, resettable floating-gate amplifier (RFGA) with lower gain and wider dynamic range provides output in parallel to the FGA. The device features four-phase buried-channel construction and a polysilicon gate design tailored to produce optimum broad-band responsivity. Input signal levels of 500 electrons have been successfully imaged and amplifier noise levels of approximately 20 electrons have been observed.
  • Keywords
    Cameras; Delay effects; Dynamic range; Electrons; Image sensors; Layout; Optical amplifiers; Semiconductor device measurement; Sensor arrays; Signal resolution;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20089
  • Filename
    1480882