DocumentCode
1069932
Title
A large area TDI image sensor for low light level imaging
Author
Farrier, Michael G. ; Dyck, Rudolph H.
Author_Institution
Fairchild Camera and Instrument Corporation, Palo Alto, CA
Volume
27
Issue
8
fYear
1980
fDate
8/1/1980 12:00:00 AM
Firstpage
1688
Lastpage
1693
Abstract
A 1030 × 128 element time delay and integration (TDI) CCD image sensor has been developed for low-light-level (L3) imaging applications. For L3imaging, output is derived from a high-gain low-noise floating-gate amplifier (FGA). For larger input signal levels, a second, resettable floating-gate amplifier (RFGA) with lower gain and wider dynamic range provides output in parallel to the FGA. The device features four-phase buried-channel construction and a polysilicon gate design tailored to produce optimum broad-band responsivity. Input signal levels of 500 electrons have been successfully imaged and amplifier noise levels of approximately 20 electrons have been observed.
Keywords
Cameras; Delay effects; Dynamic range; Electrons; Image sensors; Layout; Optical amplifiers; Semiconductor device measurement; Sensor arrays; Signal resolution;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.20089
Filename
1480882
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