Title :
Enhanced degradation rates in temperature-sensitive Ga1-xAlxAs lasers
Author :
Goodwin, A.R. ; Kirkby, P.A. ; Pion, M. ; Baulcomb, R.S.
Author_Institution :
Standard Telecommunication Laboratories Ltd., Essex, England
fDate :
8/1/1977 12:00:00 AM
Abstract :
It is found that lasers with good temperature stability of threshold exhibit rates of increase of threshold with operating time which follow a log-normal distribution characterized by values of mean and standard deviation of 3.0 and 2.5 percent/kh, respectively, but lasers with poor temperature stability degrade too rapidly to fit this distribution. Possible reasons for this behavior are discussed.
Keywords :
Degradation; Fiber lasers; Laser stability; Life testing; Mesons; Nitrogen; Temperature dependence; Temperature distribution; Temperature sensors; Wafer bonding;
Journal_Title :
Quantum Electronics, IEEE Journal of
DOI :
10.1109/JQE.1977.1069424
