DocumentCode
1070017
Title
Analog floating-point BiCMOS sampling chip and architecture of the BaBar CsI calorimeter front-end electronics system at the SLAC B-factory
Author
Haller, Gunther M. ; Freytag, Dietrich R.
Author_Institution
Linear Accel. Center, Stanford Univ., CA, USA
Volume
43
Issue
3
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
1610
Lastpage
1614
Abstract
The design and implementation of an analog floating-point sampling integrated circuit for the BaBar detector at the SLAC B-Factory is described. The CARE (Custom Auto-Range Encoding) circuit is part of an 18-bit dynamic range sampling system with a 4-MHz waveform digitization rate for the CsI calorimeter. The architecture and methodology of the system are described. The CARE integrated circuit receives dual-range (gain of 1 and 32) 13-bit signals from the 18-bit range preamplifiers mounted directly on the CsI crystals and converts the input at a rate of 4 MHz to an auto-range floating-point format with a 10-bit analog mantissa and 2 digital range bits (for 4 ranges). Additional functions integrated on the chip are averaging and selection circuitry for signals originating from two independent diodes per crystal and range-selection overwrite circuitry. The circuit will be mounted within the detector structure and thus low power dissipation is essential. The circuit has been fabricated in a 1.2-μm BiCMOS process with polysilicon-to-polysilicon capacitors and polysilicon resistors. Measurement results are presented. One complete CARE channel dissipates 25 mW
Keywords
BiCMOS analogue integrated circuits; caesium compounds; detector circuits; nuclear electronics; solid scintillation detectors; 4 MHz; BaBar CsI calorimeter front-end electronics system; CARE integrated circuit; CsI; Custom Auto-Range Encoding circuit; SLAC B-factory; analog floating-point BiCMOS sampling chip; architecture; auto-range floating-point format; polysilicon resistors; polysilicon-to-polysilicon capacitors; preamplifiers; range-selection overwrite circuitry; Analog integrated circuits; BiCMOS integrated circuits; Crystals; Detectors; Digital integrated circuits; Diodes; Dynamic range; Power dissipation; Preamplifiers; Sampling methods;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.507156
Filename
507156
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