Title :
Benchmark Tests for MOSFET Compact Models With Application to the PSP Model
Author :
Li, Xin ; Wu, Weimin ; Jha, Amit ; Gildenblat, Gennady ; Van Langevelde, Ronald ; Smit, Geert D J ; Scholten, Andries J. ; Klaassen, Dirk B M ; McAndrew, Colin C. ; Watts, Josef ; Olsen, C. Michael ; Coram, Geoffrey J. ; Chaudhry, Samir ; Victory, James
Author_Institution :
Arizona State Univ., Tempe, AZ
Abstract :
This paper presents the results of several qualitative ldquobenchmarkrdquo tests that were used to verify the physical behavior of the PSP model and its usefulness for future generations of CMOS IC design. These include newly developed tests and new experimental data stemming from low-power, RF, mixed-signal, and analog applications of MOSFETs.
Keywords :
MOSFET; MOSFET compact models; analog application; mixed-signal application; Application specific integrated circuits; Benchmark testing; CMOS integrated circuits; Circuit testing; Integrated circuit modeling; Integrated circuit testing; MOSFET circuits; Radio frequency; Research and development; Semiconductor device modeling; Benchmark tests; MOSFET; compact model; surface-potential-based model;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.2010570
