• DocumentCode
    1070082
  • Title

    High Voltage Driver for RSFQ Digital Signal Processor

  • Author

    Soloviev, Igor I. ; Rafique, M. Raihan ; Engseth, Henrik ; Kidiyarova-Shevchenko, Anna

  • Author_Institution
    Moscow State Univ., Moscow
  • Volume
    17
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    470
  • Lastpage
    473
  • Abstract
    We present an Rapid Single Flux Quantum (RSFQ) based high voltage driver (HVD) developed for the first amplification stage of a hybrid semiconductor-superconductor memory interface for the RSFQ digital signal processor. Implementation of the driver allows to eliminate the impedance mismatch between RSFQ and standard 50 Omega input of semiconductor electronics and increases the signal-to-noise ratio to reach reliable signal transmission with sufficiently low bit error rate. The driver design is based on the serial stack of 8 SQUIDs with specially configured ground-cuts that form a quasi-coplanar line with 50 Omega impedance. The impedance of the driver has been extracted using 3D EM simulators that accurately take into account multilayer structure and capacitance to the ground. The circuit has been designed for the Hypres 4.5 kA/cm2 process. The driver was simulated numerically in PSCAN. The driver can produce output signal at 1 Gbit/s speed and 2.4 mV signal level that is enough to be sensed by low-noise amplifier on the further amplification stage.
  • Keywords
    SQUIDs; digital signal processing chips; driver circuits; error statistics; monolithic integrated circuits; power integrated circuits; superconducting integrated circuits; 3D EM simulator; Hypres; PSCAN; RSFQ digital signal processor; SQUID; bit error rate; capacitance; driver design; high voltage driver; hybrid semiconductor-superconductor memory interface; impedance mismatch; multilayer structure; rapid single flux quantum based driver; semiconductor electronics; serial stack; signal-to-noise ratio; Bit error rate; Circuit simulation; Digital signal processors; Driver circuits; Impedance; Nonhomogeneous media; SQUIDs; Semiconductor device reliability; Signal to noise ratio; Voltage; High voltage driver; RSFQ; quasi-coplanar line;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.898070
  • Filename
    4277725