DocumentCode
1070254
Title
Constriction resistance at high signal frequencies
Author
Lavers, John Douglas ; Timsit, Roland S.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
Volume
25
Issue
3
fYear
2002
fDate
9/1/2002 12:00:00 AM
Firstpage
446
Lastpage
452
Abstract
This paper describes the dependence of constriction resistance on signal frequency. This dependence was calculated for circular constrictions ranging in diameter from 10 to 100 μm, and for frequencies ranging from dc to 1 GHz. The results indicate that the magnitude of constriction resistance does not deviate appreciably from values predicted by Holm´s classical analytical expression, as long as the skin depth is large compared with the constriction radius. For skin depths that are much smaller than the constriction radius, constriction resistance decreases with increasing frequency to an apparent limiting value independent of the constriction radius. At high frequencies, constriction resistance constitutes only one of two components of the total connection resistance measured in practice. The second component of connection resistance is determined by details of the geometry and dimensions of the contact interface, and increases with signal frequency.
Keywords
contact resistance; finite element analysis; skin effect; 0 to 1 GHz; 10 to 100 micron; Holm classical analytical expression; apparent limiting value; circular constrictions; constriction diameter; constriction radius; constriction resistance; contact interface geometry; contact resistance; electrical contacts; finite element method; high signal frequencies; skin depth; total connection resistance; Conductors; Contact resistance; Electric resistance; Electrical resistance measurement; Engine cylinders; Frequency measurement; Geometry; Rough surfaces; Skin; Surface resistance;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/TCAPT.2002.804610
Filename
1159181
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