• DocumentCode
    1070254
  • Title

    Constriction resistance at high signal frequencies

  • Author

    Lavers, John Douglas ; Timsit, Roland S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont., Canada
  • Volume
    25
  • Issue
    3
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    446
  • Lastpage
    452
  • Abstract
    This paper describes the dependence of constriction resistance on signal frequency. This dependence was calculated for circular constrictions ranging in diameter from 10 to 100 μm, and for frequencies ranging from dc to 1 GHz. The results indicate that the magnitude of constriction resistance does not deviate appreciably from values predicted by Holm´s classical analytical expression, as long as the skin depth is large compared with the constriction radius. For skin depths that are much smaller than the constriction radius, constriction resistance decreases with increasing frequency to an apparent limiting value independent of the constriction radius. At high frequencies, constriction resistance constitutes only one of two components of the total connection resistance measured in practice. The second component of connection resistance is determined by details of the geometry and dimensions of the contact interface, and increases with signal frequency.
  • Keywords
    contact resistance; finite element analysis; skin effect; 0 to 1 GHz; 10 to 100 micron; Holm classical analytical expression; apparent limiting value; circular constrictions; constriction diameter; constriction radius; constriction resistance; contact interface geometry; contact resistance; electrical contacts; finite element method; high signal frequencies; skin depth; total connection resistance; Conductors; Contact resistance; Electric resistance; Electrical resistance measurement; Engine cylinders; Frequency measurement; Geometry; Rough surfaces; Skin; Surface resistance;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2002.804610
  • Filename
    1159181