• DocumentCode
    1070362
  • Title

    SIS Mixers Based on NbN Techniques for ALMA Band 10

  • Author

    Takeda, Masanori ; Uzawa, Yoshinori ; Wang, Zhen

  • Author_Institution
    Nat. Inst. of Inf. and Commun. Technol., Kobe
  • Volume
    17
  • Issue
    2
  • fYear
    2007
  • fDate
    6/1/2007 12:00:00 AM
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    We designed, fabricated, and tested SIS mixers based on NbN techniques and estimated the specific capacitance of NbN/AlN/NbN tunnel junctions, which were fabricated by DC-magnetron sputtering, by measuring DC-SQUID resonance steps. In the mixers, NbN/AlN/NbN junctions and NbN/Si O2/Al tuning circuits were used for investigating receiver performance at frequencies greater than 900 GHz. The specific capacitance of the junction was estimated at 120 fF/ mum2 with a critical current density of 12 kA/cm2 . The resonance frequencies generated in the tuning circuits linearly changed with respect to the tuning lengths up to at least 1.1 THz. We found that an input-circuit structure, which we used, is a factor that degrades receiver noise at frequencies greater than 900 GHz.
  • Keywords
    SQUIDs; aluminium compounds; capacitance; critical current density (superconductivity); niobium compounds; superconductive tunnelling; superconductor-insulator-superconductor mixers; type II superconductors; ALMA band 10; Atacama large millimeter array; DC-SQUID resonance steps; DC-magnetron sputtering; NbN techniques; NbN-AlN-NbN - Interface; NbN-SiO2-Al - Interface; SIS mixers; capacitance; critical current density; frequency 1.1 THz; frequency 900 GHz; input-circuit structure; receiver noise; tuning circuits; tuning lengths; tunnel junctions; Capacitance measurement; Circuit noise; Circuit optimization; Critical current density; Degradation; RLC circuits; Resonance; Resonant frequency; Sputtering; Testing; Fourier transform spectrometer; SIS mixers; niobium nitride; submillimeter wave;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2007.898568
  • Filename
    4277751