Title :
The micromagnetics of defects in film stacks with interlayer exchange coupling
Author :
van den Berg, H.A.M. ; Schmeusser, S.
Author_Institution :
Siemens AG, Erlangen, Germany
fDate :
11/1/1993 12:00:00 AM
Abstract :
The impact of defects in trilayers comprising two ferromagnetic layers, being mutually exchange coupled via a nonferromagnetic layer, are theoretically studied on the basis of a numerical model. The defect region is characterized by deviations in the uniaxial and cubic anisotropy, in the interlayer coupling, bulk exchange constants and/or saturation magnetization. The model is two-dimensional and employs the Ritz method to evaluate the four walls that are bounding the defect. Three irreversible processes are distinguished at which the splitting up of the above edge walls is most striking. Hysteresis curves of stacks with both cubic and uniaxial anisotropy are shown. The implications of the defects for giant magnetoresistive signals are given, at which the change in the overall hysteresis loop and in the magnetization distribution near the defect is distinguished
Keywords :
crystal defects; exchange interactions (electron); ferromagnetic properties of substances; magnetic anisotropy; magnetic hysteresis; magnetic multilayers; magnetic thin films; magnetoresistance; Ritz method; bulk exchange constants; cubic anisotropy; defect region; edge walls; ferromagnetic layers; film stacks; giant magnetoresistive signals; hysteresis curves; interlayer exchange coupling; irreversible processes; magnetization distribution; micromagnetics; model; nonferromagnetic layer; numerical model; overall hysteresis loop; saturation magnetization; trilayers; two-dimensional; uniaxial anisotropy; Couplings; Giant magnetoresistance; Magnetic anisotropy; Magnetic films; Magnetic hysteresis; Magnetic sensors; Magnetic separation; Micromagnetics; Perpendicular magnetic anisotropy; Saturation magnetization;
Journal_Title :
Magnetics, IEEE Transactions on