• DocumentCode
    1070383
  • Title

    Structural and magnetic characteristics of BaFe12O19/ZnO multilayers by arc discharge evaporation

  • Author

    Naoe, Masahiko ; Nakagawa, Shigeki

  • Author_Institution
    Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
  • Volume
    29
  • Issue
    6
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    3096
  • Lastpage
    3098
  • Abstract
    The vacuum-arc evaporation method is applied to prepare BaFe12O19/ZnO multilayers with sharp periodic structure. The film consists of 25 bilayers composed of 120 Å BaFe 12O19 and 12 Å ZnO layers and shows excellent orientation of the c-axis in crystallites normal to the layer plane. They reveal an apparent perpendicular magnetic anisotropy and exhibit moderately large saturation magnetization and properly high coercivity applicable for perpendicular recording disks. This seems to originate from the crystalline anisotropy along the c-axis of BaFe12O19 crystallites. The orientation of the c-axis normal to the film plane might be caused by the c-axis orientation of crystallites in ZnO layers
  • Keywords
    barium compounds; coercive force; crystallites; ferrimagnetic properties of substances; ferrites; magnetic anisotropy; magnetic multilayers; magnetic thin films; vacuum deposited coatings; vacuum deposition; zinc compounds; BaFe12O19 crystallites; BaFe12O19-ZnO multilayers; apparent perpendicular magnetic anisotropy; arc discharge evaporation; c-axis orientation; coercivity; crystalline anisotropy; layer plane; magnetic characteristics; normal; perpendicular recording disks; saturation magnetization; sharp periodic structure; structural characteristics; vacuum-arc evaporation method; Coercive force; Crystallization; Magnetic anisotropy; Magnetic films; Magnetic multilayers; Periodic structures; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Saturation magnetization; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.280888
  • Filename
    280888