Title :
A Diagnostic for the Condition of Dielectrics
Author :
Teitler, S. ; Ngai, K.L.
Author_Institution :
Naval Research Laboratory Washington, D. C. 20375
Abstract :
It is pointed out that the determination of a key parameter that enters into a recent, widely applicable theory of the dynamics of low frequency phenomena, may be a sensitive means to monitor the status of a dielectric. It is shown how, in principle, measurements of dielectric susceptibility and/or thermal voltage noise provide the means to determine that parameter.
Keywords :
Condition monitoring; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency; Laboratories; Microscopy; Noise measurement; Polarization; Voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1981.298436
