• DocumentCode
    1070452
  • Title

    A new Josephson junction with a very short barrier length and a very low capacitance

  • Author

    Ohta, Hiroshi

  • Author_Institution
    Institute of Physical and Chemical Research, Hirosawa, Saitama, Japan
  • Volume
    27
  • Issue
    10
  • fYear
    1980
  • fDate
    10/1/1980 12:00:00 AM
  • Firstpage
    2027
  • Lastpage
    2029
  • Abstract
    Josephson junctions of a new geometrical structure were fabricated and have turned out to be of good quality. They are almost-planar niobium-based bismuth-barrier Josephson junctions which have a barrier length of 75 nm and a capacitance of 0.04 pF. The amplitudes of the zero-voltage current and microwave-induced constant-voltage current steps periodically vanish several times as the power of the applied microwave radiation increases monotonically. The junctions suffer from no degradation due to interdiffusion of metals at room temperature. They are very resistant to unavoidable electrical pulses.
  • Keywords
    Bridges; Capacitance; Degradation; Electrodes; Josephson junctions; Niobium; Radiation detectors; Resistance; Superconducting films; Superconducting photodetectors;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1980.20140
  • Filename
    1480933