DocumentCode
1070452
Title
A new Josephson junction with a very short barrier length and a very low capacitance
Author
Ohta, Hiroshi
Author_Institution
Institute of Physical and Chemical Research, Hirosawa, Saitama, Japan
Volume
27
Issue
10
fYear
1980
fDate
10/1/1980 12:00:00 AM
Firstpage
2027
Lastpage
2029
Abstract
Josephson junctions of a new geometrical structure were fabricated and have turned out to be of good quality. They are almost-planar niobium-based bismuth-barrier Josephson junctions which have a barrier length of 75 nm and a capacitance of 0.04 pF. The amplitudes of the zero-voltage current and microwave-induced constant-voltage current steps periodically vanish several times as the power of the applied microwave radiation increases monotonically. The junctions suffer from no degradation due to interdiffusion of metals at room temperature. They are very resistant to unavoidable electrical pulses.
Keywords
Bridges; Capacitance; Degradation; Electrodes; Josephson junctions; Niobium; Radiation detectors; Resistance; Superconducting films; Superconducting photodetectors;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.20140
Filename
1480933
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