DocumentCode
1070604
Title
A simplified two-dimensional numerical analysis of MOS devices—DC case
Author
Oh, Soo-Young ; Dutton, Robert W.
Author_Institution
Stanford University, Stanford, CA
Volume
27
Issue
11
fYear
1980
fDate
11/1/1980 12:00:00 AM
Firstpage
2101
Lastpage
2108
Abstract
A simplified two-dimensional numerical analysis program has been developed for MOS devices. The calculation speed of this program is an order of magnitude faster than that of the finite-difference or finite-element methods due to the reduced number of analysis node points. The method solves only a one-dimensional current-continuity equation along the channel. Poisson´s equation in two dimensions is replaced by an initial solution and a boundary-value problem formulation for the incremental potential and charge. In this method, the nodes are allocated only along the boundaries and the channel; therefore, it has a much smaller number of nodes than that required for other methods. MOS characteristics are simulated and compared with results from the finite-difference program [2], [9]. The agreement is satisfactory within 10 percent over a wide range of the substrate doping concentrations and channel lengths.
Keywords
Boundary conditions; Central Processing Unit; Charge carrier processes; Doping; Finite difference methods; Finite element methods; MOS devices; MOSFET circuits; Numerical analysis; Poisson equations;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1980.20156
Filename
1480949
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