• DocumentCode
    1070634
  • Title

    Current-voltage characteristics of molecular conductors: two versus three terminal

  • Author

    Damle, Prashant ; Rakshit, Titash ; Paulsson, Magnus ; Datta, Supriyo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • Volume
    1
  • Issue
    3
  • fYear
    2002
  • fDate
    9/1/2002 12:00:00 AM
  • Firstpage
    145
  • Lastpage
    153
  • Abstract
    Addresses the question of whether a "rigid molecule" (one which does not deform in an external field) used as the conducting channel in a standard three-terminal MOSFET configuration can offer any performance advantage relative to a standard silicon MOSFET. A self-consistent solution of coupled quantum transport and Poisson\´s equations shows that even for extremely small channel lengths (about 1 nm), a "well-tempered" molecular FET demands much the same electrostatic considerations as a "well-tempered" conventional MOSFET. In other words, we show that just as in a conventional MOSFET, the gate oxide thickness needs to be much smaller than the channel length (length of the molecule) for the gate control to be effective. Furthermore, we show that a rigid molecule with metallic source and drain contacts has a temperature independent subthreshold slope much larger than 60 mV/decade, because the metal-induced gap states in the channel prevent it from turning off abruptly. However, this disadvantage can be overcome by using semiconductor contacts because of their band-limited nature.
  • Keywords
    Green´s function methods; Poisson equation; insulated gate field effect transistors; molecular electronics; Poisson´s equations; channel lengths; conducting channel; coupled quantum transport; current-voltage characteristics; gate oxide thickness; metal-induced gap states; molecular FET; rigid molecule; self-consistent solution; semiconductor contacts; temperature independent subthreshold slope; three-terminal MOSFET configuration; Conductors; Current-voltage characteristics; Electrostatics; FETs; MOSFET circuits; Poisson equations; Silicon; Temperature; Thickness control; Turning;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2002.806825
  • Filename
    1159215