Microstructure and giant magnetoresistance in Co/Ag films

Author

Tsoukatos, A. ; Wan, H. ; Hadjipanayis, G.C. ; Lawless, K.R.

Author_Institution

Dept. of Phys. & Astron., Delaware Univ., Newark, DE, USA

Volume

29

Issue

6

fYear

1993

fDate

11/1/1993 12:00:00 AM

Firstpage

2726

Lastpage

2728

Abstract

Giant magnetoresistance values are observed in Co/Ag composite films. The largest change in magnetoresistance values is measured in the as-deposited Ag-rich samples with maxima on the order of 30%, at 30 K. X-ray diffraction and electron microscope studies indicate a uniform FCC structure with an apparent composition dependent lattice parameter. High resolution electron micrographs provide the first evidence of Co clustering in an Ag matrix via the observation of the lattice spacing which clearly corresponds to the (200) line of FCC Co. It is believed that the GMR is due to interfacial scattering from these clusters

Keywords

X-ray diffraction examination of materials; cobalt alloys; crystal microstructure; electron microscope examination of materials; interface structure; lattice constants; magnetic thin films; magnetoresistance; nanostructured materials; silver alloys; 5 to 295 K; Co-Ag; Co-Ag films; Co₂₈Ag₇₂; Co₃₃Ag₆₇; DC susceptibility; HREM; X-ray diffraction; clustering; composite films; composition dependent lattice parameter; electron microscope studies; giant magnetoresistance; interfacial scattering; magnetic moments; microstructure; uniform FCC structure; Crystal microstructure; Electron microscopy; Giant magnetoresistance; Lattices; Magnetic films; Magnetic properties; Magnetic separation; Sputtering; X-ray diffraction; X-ray scattering;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.280930

Filename

280930