Title :
TA-A4 analysis of alpha-particle-induced soft errors in static RAM
Author :
Ando, Makoto ; Tsujide, T.
fDate :
11/1/1980 12:00:00 AM
Keywords :
Alpha particles; Cities and towns; Computer errors; Conductivity; Grain size; Measurement techniques; Random access memory; Read-write memory; Resistors; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20194
