DocumentCode

1071005

Title

TA-A4 analysis of alpha-particle-induced soft errors in static RAM

Author

Ando, Makoto ; Tsujide, T.

Volume

27

Issue

11

fYear

1980

fDate

11/1/1980 12:00:00 AM

Firstpage

2183

Lastpage

2184

Keywords

Alpha particles; Cities and towns; Computer errors; Conductivity; Grain size; Measurement techniques; Random access memory; Read-write memory; Resistors; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1980.20194

Filename

1480987