Title :
Operating Margins of a 10 V Programmable Josephson Voltage Standard Circuit Using NbN/TiNx/NbN/TiNx/NbN
Author :
Yamamori, Hirotake ; Ishizaki, Mayumi ; Sasaki, Hitoshi ; Shoji, Akira
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba
fDate :
6/1/2007 12:00:00 AM
Abstract :
The operating margins of a 10 V programmable Josephson voltage standard circuit using Operating margins of a 10 V programmable josephson voltage standard circuit using NbN/TiNx/NbN/TiNx/NbN double-junction stacks was investigated as a function of microwave frequency and operating temperature. The circuit contained 32 arrays of 5 120 Operating margins of a 10 V programmable josephson voltage standard circuit using NbN/TiNx/NbN/TiNx/NbN double-junction stacks. In other words, the circuit contained 327 680 Operating margins of a 10 V programmable Josephson voltage standard circuit using NbN/TiNx/NbN/TiNx/NbN junctions. It was found that the operating margins (the heights of the constant-voltage step) of the arrays varied largely with microwave frequency and operating temperature. The microwave-frequency dependence was due to the resonance of the microwaves in the circuit. The temperature dependence of the circuit was due to the temperature dependence of the IcRn product of the junctions, where Ic was the critical current Rn and was the normal resistance. Fortunately, however, the operating margin was maximized by changing the temperature of the chip, mounted on the cold head of a cryocooler.
Keywords :
integrated circuit design; measurement standards; niobium compounds; programmable circuits; superconducting integrated circuits; superconducting microwave devices; titanium compounds; voltage measurement; NbN-TiN - Interface; chip; critical current; cryocooler; double-junction stacks; microwave frequency; programmable josephson voltage standard circuit; voltage 10 V; Fabrication; Josephson junctions; Microwave circuits; Microwave frequencies; Niobium; Superconducting device noise; Superconducting devices; Superconducting microwave devices; Temperature dependence; Voltage; ${rm TiN}_{x}$ ; Cryocooler; NbN; PJVS; margin;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2007.901444