Title :
DMILL, a mixed analog-digital radiation-hard BICMOS technology for high energy physics electronics
Author :
Dentan, M. ; Abbon, P. ; Delagnes, E. ; Fourches, N. ; Lachartre, D. ; Lugiez, F. ; Paul, Biju ; Rouger, M. ; Truche, R. ; Blanc, J.P. ; Leroux, Camille ; Delevoye-Orsier, E. ; Pelloie, J.L. ; de Pontcharra, J. ; Flament, O. ; Guebhard, J.M. ; Leray, J.L.
Author_Institution :
CEA, Centre d´Etudes Nucleaires de Saclay, Gif-sur-Yvette
fDate :
6/1/1996 12:00:00 AM
Abstract :
High Energy Physics experiments under preparation at CERN (Geneva, Switzerland) with the future LHC (Large Hadron collider) require a fast, low noise, very rad-hard, mixed analog-digital microelectronics VLSI technology. Readout electronics designed using such a technology for the central parts of the LHC particle detectors must withstand more than 10 Mrad (SiO2) and 1014 neutrons/cm2 over 10 years of operation. We present here recent results obtained with a new rad-hard analog-digital technology called DMILL, which monolithically integrates NPN bipolar, CMOS and P-JFET transistors, and which has been specifically developed to fulfill the severe constraints of LHC detector readout circuits
Keywords :
BiCMOS analogue integrated circuits; BiCMOS digital integrated circuits; CMOS analogue integrated circuits; CMOS digital integrated circuits; JFET integrated circuits; VLSI; detector circuits; field effect analogue integrated circuits; field effect digital integrated circuits; mixed analogue-digital integrated circuits; monolithic integrated circuits; nuclear electronics; 10 Mrad; CERN; CMOS transistors; DMILL; LHC detector readout circuits; LHC particle detectors; NPN bipolar transistor; P-JFET transistor; high energy physics electronics; mixed analog-digital microelectronics VLSI technology; mixed analog-digital radiation-hard BICMOS technology; Analog-digital conversion; BiCMOS integrated circuits; CMOS technology; Large Hadron Collider; Microelectronics; Neutrons; Radiation detectors; Radiation hardening; Readout electronics; Very large scale integration;
Journal_Title :
Nuclear Science, IEEE Transactions on
