Title :
WA-B4 Leakage current in GaAs MESFET´s with GaAs and Ga1-xAlxAs buffer layers
Author :
Tiwari, Sunita ; Levy, H.M. ; Tiberio, R. ; Eastman, L.F.
fDate :
11/1/1980 12:00:00 AM
Keywords :
Aluminum; Buffer layers; Current measurement; Electron traps; Fingers; Gallium arsenide; Geometry; Leakage current; MESFETs;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20231
