Title :
On Compatibility between Thermal and Electrical Stress
Author_Institution :
Instituto di Elettrotecnica Industriale University of Bologna, Bologna (Italy)
Keywords :
Aging; Dielectrics and electrical insulation; Equations; H infinity control; Life testing; Temperature dependence; Temperature distribution; Thermal force; Thermal stresses; Threshold voltage;
Journal_Title :
Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TEI.1982.298512
