Title :
WP-B6 dark-current mechanisms in long-wavelength n+-on-p Hg0.8Cd0.2Te photodiodes over the 200-10-K temperature range
Author :
Tobin, S.P. ; Briggs, R.J. ; Sood, Ashok ; Reine, M.B.
fDate :
11/1/1980 12:00:00 AM
Keywords :
Character recognition; Contracts; Dark current; Laboratories; Leakage current; Photodiodes; Tellurium; Temperature dependence; Temperature distribution; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1980.20248
