Title :
Accurate Characterization of Integrated Continuous-Time Filters
Author :
Pavan, Shanthi ; Laxminidhi, Tonse
Author_Institution :
Indian Inst. of Technol., Chennai
Abstract :
We present techniques for accurately characterizing the frequency response and noise spectral density of integrated continuous-time filters. A 75-MHz fifth-order Chebyshev Gm-C ladder filter designed in a 0.35-mum CMOS process and packaged in a 40-pin DIP is used as a test vehicle to validate the ideas proposed in this work. When compared to conventional frequency response measurement methods, the proposed techniques show a significantly enhanced measurement accuracy in the stopband, while being less sensitive to package characteristics.
Keywords :
CMOS analogue integrated circuits; Chebyshev filters; continuous time filters; frequency response; ladder filters; CMOS process; fifth-order Chebyshev Gm-C ladder filter; frequency 75 MHz; frequency response; integrated continuous-time filter; noise spectral density; size 0.35 micron; Active filters; CMOS process; Chebyshev approximation; Electronics packaging; Frequency measurement; Frequency response; Microwave filters; Testing; Transfer functions; Vehicles; Characterization; de-embedding; integrated filters; microwave;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2007.900288
