Title :
Investigation of microplasmas in InP avalanche photodiodes
Author :
Capasso, F. ; Petroff, P.M. ; Bonner, W.B. ; Sumski, S.
Author_Institution :
Bell Laboratories, Murray Hill, NJ
fDate :
3/1/1980 12:00:00 AM
Abstract :
The electron beam induced current technique has been used to investigate microplasmas in InP avalanche photodiodes. It is shown that microplasmas develop along growth induced doping striations. Slope discontinuities in the I-V characteristic have been correlated to the turn on voltage of microplasmas.
Keywords :
Avalanche photodiodes; Breakdown voltage; Current measurement; Diodes; Impurities; Indium phosphide; Iron; Leakage current; Low voltage; Testing;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1980.25218
