DocumentCode
1072079
Title
Etching and the Morphology of Cross-Linked Polyethylene Cable Insulation
Author
Bamji, S. ; Bulinski, A. ; Densley, J. ; Garton, A.
Author_Institution
National Research Council of Canada Ottawa, Canada
Issue
1
fYear
1983
Firstpage
32
Lastpage
41
Abstract
The techniques of etching by carbon tetrachloride vapor and by permanganic acid are shown to be prone to artifacts, and so earlier conclusions based on these techniques, i.e. that XLPE cable insulation has a large scale (>> 10 ¿m) spherulitic texture structure, need to be reexamined. A comparison with XLPE film samples, where spherulite size is readily determinable by small-angle light scattering and optical microscopy, indicates that typical spherulite dimensions are <5 ¿m. Examination of freeze-fractured surfaces through XLPE insulation containing water-trees revealed cavities up to 10 pm diameter with no evidence of interconnecting channels. Freeze-fractured surfaces through electrical trees revealed channels several micrometers in diameter with evidence of extensive melting and polymer degradation.
Keywords
Cable insulation; Etching; Large-scale systems; Light scattering; Optical films; Optical interconnections; Optical microscopy; Optical polymers; Polyethylene; Surface morphology;
fLanguage
English
Journal_Title
Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
0018-9367
Type
jour
DOI
10.1109/TEI.1983.298580
Filename
4081043
Link To Document