DocumentCode :
1072165
Title :
CMOS Charge Pump With Transfer Blocking Technique for No Reversion Loss and Relaxed Clock Timing Restriction
Author :
Kim, Joung-Yeal ; Jun, Young-Hyun ; Kong, Bai-Sun
Author_Institution :
Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon
Volume :
56
Issue :
1
fYear :
2009
Firstpage :
11
Lastpage :
15
Abstract :
A CMOS charge pump based on a transfer blocking technique and a modified precharge scheme is proposed for avoiding reversion loss and relaxing the timing restrictions imposed on input clocks. Comparison results in an 80-nm CMOS process indicate that, with no loading current, the output voltage of the proposed charge pump reaches almost 98% of the ideal boosting level with switching ripple reduced by up to 97%. They also indicate that output voltage deviations due to temperature and process variations are reduced by 24%-98% and 81%-95%, respectively.
Keywords :
CMOS integrated circuits; charge pump circuits; timing; CMOS charge pump; boosting level; no reversion loss; relaxed clock timing restriction; size 80 nm; switching ripple; transfer blocking technique; voltage doubler; voltage generator; Boosting; CMOS process; Charge pumps; Charge transfer; Clocks; Diodes; MOSFETs; Temperature; Threshold voltage; Timing; Blocking technique; charge pump; voltage doubler; voltage generator;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2008.2008521
Filename :
4753686
Link To Document :
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