DocumentCode
1072261
Title
Ring oscillators fabricated in laser-annealed silicon-on-insulator
Author
Lam, H.W. ; Tasch, A.F., Jr. ; Holloway, T.C. ; Lee, K.F. ; Gibbons, J.F.
Author_Institution
Texas Instruments Incorporated, Dallas, Texas
Volume
1
Issue
6
fYear
1980
fDate
6/1/1980 12:00:00 AM
Firstpage
99
Lastpage
100
Abstract
Both seven and eleven stage n-MOS ring oscillators with 6 µm channel length have been successfully fabricated in scanning. CW argon laser-annealed polycrystalline silicon islands, which are defined prior to the laser annealing step, on oxide substrates. The ring oscillators, which have a fan-out of three, have a switching delay per stage of 58 nsec and a power-delay product of about 7 pJ operating at a supply voltage (VDD ) of 5 volts and switching between VDD and ground. The most serious difficulty encountered during circuit fabrication was the deformation of the silicon islands resulting from laser annealing with extensive laser power density.
Keywords
Annealing; Argon; Circuits; Delay; Optical device fabrication; Power lasers; Ring lasers; Ring oscillators; Silicon on insulator technology; Voltage-controlled oscillators;
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/EDL.1980.25245
Filename
1481107
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