DocumentCode :
1072261
Title :
Ring oscillators fabricated in laser-annealed silicon-on-insulator
Author :
Lam, H.W. ; Tasch, A.F., Jr. ; Holloway, T.C. ; Lee, K.F. ; Gibbons, J.F.
Author_Institution :
Texas Instruments Incorporated, Dallas, Texas
Volume :
1
Issue :
6
fYear :
1980
fDate :
6/1/1980 12:00:00 AM
Firstpage :
99
Lastpage :
100
Abstract :
Both seven and eleven stage n-MOS ring oscillators with 6 µm channel length have been successfully fabricated in scanning. CW argon laser-annealed polycrystalline silicon islands, which are defined prior to the laser annealing step, on oxide substrates. The ring oscillators, which have a fan-out of three, have a switching delay per stage of 58 nsec and a power-delay product of about 7 pJ operating at a supply voltage (VDD) of 5 volts and switching between VDDand ground. The most serious difficulty encountered during circuit fabrication was the deformation of the silicon islands resulting from laser annealing with extensive laser power density.
Keywords :
Annealing; Argon; Circuits; Delay; Optical device fabrication; Power lasers; Ring lasers; Ring oscillators; Silicon on insulator technology; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/EDL.1980.25245
Filename :
1481107
Link To Document :
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