Title :
A technique for suppressing dark current generated by interface states in buried channel CCD imagers
Author_Institution :
Naval Research Laboratory, Washington, D.C
fDate :
7/1/1980 12:00:00 AM
Abstract :
A technique for operating buried channel CCD imagers to achieve very low dark current with no loss in optical sensitivity is described. Using this technique on a 4-phase CCD shift register operated in an imaging mode, the dark current is reduced from 7.0 nA/cm2to 0.60 nA/cm2at 295°K.
Keywords :
Charge coupled devices; Dark current; Doping; Electrons; Interface states; Optical losses; Optical sensors; Shift registers; Substrates; Temperature;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/EDL.1980.25259
