• DocumentCode
    1072684
  • Title

    Feedforward control of piezoactuators in atomic force microscope systems

  • Author

    Leang, Kam K. ; Zou, Qingze ; Devasia, Santosh

  • Author_Institution
    Univ. Nevada-Reno, Reno, NV
  • Volume
    29
  • Issue
    1
  • fYear
    2009
  • Firstpage
    70
  • Lastpage
    82
  • Abstract
    This article describes an inversion-based feedforward approach to compensate for dynamic and hysteresis effects in piezoactuators with application to AFM technology. To handle the coupled behavior of dynamics and hysteresis, a cascade model is presented to enable the application of inversion-based feedforward control. The dynamics, which include vibration and creep, are modeled using linear transfer functions. A frequency-based method is used to invert the linear model to find an input that compensates for vibration and creep. The inverse is noncausal for nonminimum-phase systems. Similarly, the hysteresis is handled by an inverse-Preisach model. To avoid the complexity of finding the inverse-Preisach model, high- gain feedback control can be used to linearize the system´s behavior. A feedforward input is then combined with the feedback system to compensate for the linear dynamics to achieve high-speed AFM imaging. Finally, recent efforts in feedforward control for an SPM application including the use of iteration to handle hysteresis as well as uncertainties and variations in the system model is discussed.
  • Keywords
    atomic force microscopy; compensation; feedback; feedforward; hysteresis; iterative methods; piezoelectric actuators; transfer functions; vibrations; AFM technology; atomic force microscope systems; dynamic effects; frequency-based method; high-gain feedback control; high-speed AFM imaging; hysteresis effects; inverse-Preisach model; inversion-based feedforward approach; inversion-based feedforward control; linear dynamics; linear transfer functions; nonminimum-phase systems; piezoactuators; Atomic force microscopy; Control systems; Creep; Feedback control; Force control; Frequency; Hysteresis; Scanning probe microscopy; Transfer functions; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Control Systems, IEEE
  • Publisher
    ieee
  • ISSN
    1066-033X
  • Type

    jour

  • DOI
    10.1109/MCS.2008.930922
  • Filename
    4753744