DocumentCode :
1072721
Title :
Space Charging Currents and Their Effects on Spacecraft Systems
Author :
Reagan, J.B. ; Meyerott, R.E. ; Gaines, E.E. ; Nightingale, R.W. ; Filbert, P.C. ; Imhof, W.L.
Author_Institution :
Space Sciences Laboratory Lockheed Palo Alto Research Laboratory Palo Alto, CA
Issue :
3
fYear :
1983
fDate :
6/1/1983 12:00:00 AM
Firstpage :
354
Lastpage :
365
Abstract :
The range and limits on the space charging electron currents available in the near-geosynchronous orbit have been identified from a large SCATHA satellite data base. The most intense current densities observed were 0.8 nA/cm2 at 1 keV and 0.5 pA/cm2 at 1 MeV. The effects of these currents on both surface and internal charging of dielectrics have been modeled. In exposed dielectrics radiation-induced effects significantly increase the conductivity within the first few ¿m of the surface, produce permanent radiation damage, and affect the final potential of the sample. The calculated electric field profiles and surface potential of a 127 ¿m Kapton® sample are found to be consistent with the voltage measured aboard the SCATHA satellite during a charging event. The calculated field strength of 2×105 V/cm is below the spontaneous breakdown level. Transient electrical pulses observed in association with the charging may therefore be due to capacitive coupling effects rather than to breakdown. The electric fields and voltage internal to both plane-parallel and coaxial geometries containing a Teflon® dielectric enclosed between two conductors have also been modeled. Electric field strengths of a few x 105 V/cm and internal potentials of several kV are calculated for these typical configurations when exposed to the direct electrons in unusually energetic events.
Keywords :
Conductivity; Current density; Dielectrics; Electric breakdown; Electrons; Satellites; Space charge; Space vehicles; Surface charging; Voltage;
fLanguage :
English
Journal_Title :
Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9367
Type :
jour
DOI :
10.1109/TEI.1983.298625
Filename :
4081111
Link To Document :
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