DocumentCode :
1072746
Title :
An Application of the EM Algorithm to Degradation Modeling
Author :
Ng, Tsan Sheng
Author_Institution :
Nat. Univ. of Singapore, Singapore
Volume :
57
Issue :
1
fYear :
2008
fDate :
3/1/2008 12:00:00 AM
Firstpage :
2
Lastpage :
13
Abstract :
We consider a class of degradation processes that can consist of distinct phases of behavior. In particular, the degradation rates could possibly increase or decrease in a non-smooth manner at some point in time when the underlying degradation process changes phase. To model the degradation path of a given device, we use an independent-increments stochastic process with a single unobserved change-point. Furthermore, we assume that the change- point varies randomly from device-to-device. The likelihood functions for such a model are analytically intractable, so in this paper we develop an EM algorithm for this model to obtain the maximum likelihood estimators efficiently. We demonstrate the applicability of the method using two different models, and present some computational results of our implementation.
Keywords :
expectation-maximisation algorithm; reliability; stochastic processes; degradation process; expectation maximization algorithm; independent-increments stochastic process; likelihood functions; maximum likelihood estimators; unobserved change-point; Change-points; EM algorithm; degradation modeling; maximum likelihood estimation;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2008.916867
Filename :
4454144
Link To Document :
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