• DocumentCode
    1072746
  • Title

    An Application of the EM Algorithm to Degradation Modeling

  • Author

    Ng, Tsan Sheng

  • Author_Institution
    Nat. Univ. of Singapore, Singapore
  • Volume
    57
  • Issue
    1
  • fYear
    2008
  • fDate
    3/1/2008 12:00:00 AM
  • Firstpage
    2
  • Lastpage
    13
  • Abstract
    We consider a class of degradation processes that can consist of distinct phases of behavior. In particular, the degradation rates could possibly increase or decrease in a non-smooth manner at some point in time when the underlying degradation process changes phase. To model the degradation path of a given device, we use an independent-increments stochastic process with a single unobserved change-point. Furthermore, we assume that the change- point varies randomly from device-to-device. The likelihood functions for such a model are analytically intractable, so in this paper we develop an EM algorithm for this model to obtain the maximum likelihood estimators efficiently. We demonstrate the applicability of the method using two different models, and present some computational results of our implementation.
  • Keywords
    expectation-maximisation algorithm; reliability; stochastic processes; degradation process; expectation maximization algorithm; independent-increments stochastic process; likelihood functions; maximum likelihood estimators; unobserved change-point; Change-points; EM algorithm; degradation modeling; maximum likelihood estimation;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2008.916867
  • Filename
    4454144