DocumentCode
1072875
Title
Validity of the Parabolic Effective Mass Approximation in Silicon and Germanium n-MOSFETs With Different Crystal Orientations
Author
Van der Steen, Jan-Laurens P J ; Esseni, David ; Palestri, Pierpaolo ; Selmi, Luca ; Hueting, Raymond J E
Author_Institution
Twente Univ., Enschede
Volume
54
Issue
8
fYear
2007
Firstpage
1843
Lastpage
1851
Abstract
This paper investigates the validity of the parabolic effective mass approximation (EMA), which is almost universally used to describe the size and bias-induced quantization in n-MOSFETs. In particular, we compare the EMA results with a full-band quantization approach based on the linear combination of bulk bands (LCBB) and study the most relevant quantities for the modeling of the mobility and of the on-current of the devices, namely, the minima of the 2-D subbands, the transport masses, and the electron density of states. Our study deals with both silicon and germanium n-MOSFETs with different crystal orientations and shows that, in most cases, the validity of the EMA is quite satisfactory. The LCBB approach is then used to calculate the values of the effective masses that help improve the EMA accuracy. There are crystal orientations, however, where the 2-D energy dispersion obtained by the LCBB method exhibits features that are difficult to reproduce with the EMA model.
Keywords
MOSFET; crystal orientation; effective mass; elemental semiconductors; germanium; silicon; Ge - Element; Si - Element; bias-induced quantization; crystal orientations; electron density; energy dispersion; full-band quantization approach; germanium; linear combination of bulk bands; n-MOSFET; parabolic effective mass approximation; silicon; CMOS technology; Computational modeling; Effective mass; Electron mobility; Germanium; MOSFET circuits; Potential well; Quantization; Semiconductor device modeling; Silicon on insulator technology; Band structure; effective mass approximation; full-band; quantization models; quantum confinement;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2007.900417
Filename
4277987
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