• DocumentCode
    1072875
  • Title

    Validity of the Parabolic Effective Mass Approximation in Silicon and Germanium n-MOSFETs With Different Crystal Orientations

  • Author

    Van der Steen, Jan-Laurens P J ; Esseni, David ; Palestri, Pierpaolo ; Selmi, Luca ; Hueting, Raymond J E

  • Author_Institution
    Twente Univ., Enschede
  • Volume
    54
  • Issue
    8
  • fYear
    2007
  • Firstpage
    1843
  • Lastpage
    1851
  • Abstract
    This paper investigates the validity of the parabolic effective mass approximation (EMA), which is almost universally used to describe the size and bias-induced quantization in n-MOSFETs. In particular, we compare the EMA results with a full-band quantization approach based on the linear combination of bulk bands (LCBB) and study the most relevant quantities for the modeling of the mobility and of the on-current of the devices, namely, the minima of the 2-D subbands, the transport masses, and the electron density of states. Our study deals with both silicon and germanium n-MOSFETs with different crystal orientations and shows that, in most cases, the validity of the EMA is quite satisfactory. The LCBB approach is then used to calculate the values of the effective masses that help improve the EMA accuracy. There are crystal orientations, however, where the 2-D energy dispersion obtained by the LCBB method exhibits features that are difficult to reproduce with the EMA model.
  • Keywords
    MOSFET; crystal orientation; effective mass; elemental semiconductors; germanium; silicon; Ge - Element; Si - Element; bias-induced quantization; crystal orientations; electron density; energy dispersion; full-band quantization approach; germanium; linear combination of bulk bands; n-MOSFET; parabolic effective mass approximation; silicon; CMOS technology; Computational modeling; Effective mass; Electron mobility; Germanium; MOSFET circuits; Potential well; Quantization; Semiconductor device modeling; Silicon on insulator technology; Band structure; effective mass approximation; full-band; quantization models; quantum confinement;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2007.900417
  • Filename
    4277987