DocumentCode :
1072875
Title :
Validity of the Parabolic Effective Mass Approximation in Silicon and Germanium n-MOSFETs With Different Crystal Orientations
Author :
Van der Steen, Jan-Laurens P J ; Esseni, David ; Palestri, Pierpaolo ; Selmi, Luca ; Hueting, Raymond J E
Author_Institution :
Twente Univ., Enschede
Volume :
54
Issue :
8
fYear :
2007
Firstpage :
1843
Lastpage :
1851
Abstract :
This paper investigates the validity of the parabolic effective mass approximation (EMA), which is almost universally used to describe the size and bias-induced quantization in n-MOSFETs. In particular, we compare the EMA results with a full-band quantization approach based on the linear combination of bulk bands (LCBB) and study the most relevant quantities for the modeling of the mobility and of the on-current of the devices, namely, the minima of the 2-D subbands, the transport masses, and the electron density of states. Our study deals with both silicon and germanium n-MOSFETs with different crystal orientations and shows that, in most cases, the validity of the EMA is quite satisfactory. The LCBB approach is then used to calculate the values of the effective masses that help improve the EMA accuracy. There are crystal orientations, however, where the 2-D energy dispersion obtained by the LCBB method exhibits features that are difficult to reproduce with the EMA model.
Keywords :
MOSFET; crystal orientation; effective mass; elemental semiconductors; germanium; silicon; Ge - Element; Si - Element; bias-induced quantization; crystal orientations; electron density; energy dispersion; full-band quantization approach; germanium; linear combination of bulk bands; n-MOSFET; parabolic effective mass approximation; silicon; CMOS technology; Computational modeling; Effective mass; Electron mobility; Germanium; MOSFET circuits; Potential well; Quantization; Semiconductor device modeling; Silicon on insulator technology; Band structure; effective mass approximation; full-band; quantization models; quantum confinement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2007.900417
Filename :
4277987
Link To Document :
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