• DocumentCode
    1073009
  • Title

    The Layered Capacitor Method for Dielectric Bridge Measurements. Data Analysis and Interpretation of Fluoride Doped ICE.

  • Author

    Gross, G.W. ; Johnson, J.

  • Author_Institution
    New Mexico Institute of Mining and Technology Socorro, New Mexico
  • Issue
    5
  • fYear
    1983
  • Firstpage
    485
  • Lastpage
    497
  • Abstract
    Dielectric relaxation in ice is due to dipole reorientation and ionic diffusion. Close-coupling complicates the interpretation, especially in samples doped with proton-supplying impurities. We report on a bridge technique using ice samples sandwiched between layers of polytetrafluoroethylene (Teflon®) . An equivalent-circuit model and a nonlinear fitting algorithm have been developed for analysis of the data. A small number of discrete relaxation ranges is assumed, each characterized by a single relaxation time. Linear volume parameters can be derived from these measurements provided that the blocking layer capacitance is small compared to the series, space-charge polarization capacitance. Nonlinear conductance effects were negligible. Next, the data are used to explore the ability of the method to resolve multiple spectra. In principle, the inversion does not yield unique spectral parameters for multiple spectra. Moreover, it was found that the equivalent-circuit model has a built-in source of non-uniqueness which amplifies fitting uncertainties when ice volume parameters are ederived from ¿effective¿ parameters of the layered capacitor. This shortcoming should be capable of improvement by further work. In conclusion, the use of linear blocking layers allowed a semiquantitative interpretation even in cases where strong overlap of relaxation processes was encountered.
  • Keywords
    Algorithm design and analysis; Bridge circuits; Capacitance measurement; Capacitors; Data analysis; Dielectric measurements; Ice; Impurities; Polarization; Volume measurement;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1983.298634
  • Filename
    4081143