• DocumentCode
    1073440
  • Title

    Ionization and Attachment Coefficients in SF6 + N2 Mixtures

  • Author

    Dincer, M.S. ; Raju, G. R Govinda

  • Author_Institution
    Department of Electrical Engineering University of Windsor Windsor, Ontario, Canada
  • Issue
    1
  • fYear
    1984
  • Firstpage
    40
  • Lastpage
    44
  • Abstract
    Steady-state ionization growth currents have been measured in N2 and SF6 + N2 mixtures in the E/N range of 1.82×101-15 ¿ E/N ¿ 2.58×10-15 V cm2. Least-square analysis is used for the evaluation of apparent ionization, ionization, and attachment coefficients. Experimental E/N limits are observed for several SF6 concentrations in the mixture. The variation of (¿-¿)/N is non-linear with the percnetage mixture ratio.
  • Keywords
    Current measurement; Dielectric breakdown; Electric variables measurement; Equations; Ionization; Pressure measurement; Steady-state; Sulfur hexafluoride; Vacuum systems; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9367
  • Type

    jour

  • DOI
    10.1109/TEI.1984.298731
  • Filename
    4081190
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1073440