DocumentCode :
1073512
Title :
Imaging Current Percolation and Ac Losses in Artificially Granular YBCO Thin Films
Author :
Bartolomé, E. ; Navau, C. ; Sánchez, A. ; Chen, D.-X. ; Puig, T. ; Obradors, X. ; Cambel, V.
Author_Institution :
Univ. Autonoma de Barcelona (UAB), Barcelona
Volume :
17
Issue :
2
fYear :
2007
fDate :
6/1/2007 12:00:00 AM
Firstpage :
3223
Lastpage :
3226
Abstract :
The magnetic effects of granularity in YBCO tapes are investigated using model granular systems. Numerical simulations of the field profile, current distribution and AC susceptibility in simple granular configurations have been carried out under a critical-state, magnetic energy minimization approach. Experimentally, an artificially patterned "multigranular" YBCO epitaxial thin film has been fabricated and used to investigate the geometry-related magnetic effects of granularity. High-resolution Hall probe microscopy measurements have allowed us imaging the evolution of the magnetization distribution with the applied field, and deduce the circulation of inter- and intragranular critical-currents. AC-susceptibility measurements up to high driving-fields evidenced that AC losses arise mainly from dissipation at the artificial "grain boundary" network.
Keywords :
Hall effect; barium compounds; critical currents; current distribution; grain boundaries; granular superconductors; high-temperature superconductors; magnetic susceptibility; magnetisation; percolation; superconducting epitaxial layers; superconducting tapes; yttrium compounds; YBa2Cu3O7; ac losses; ac susceptibility; artificial grain boundary network; artificially patterned multigranular epitaxial thin film; current distribution; current percolation; driving field; high-resolution Hall probe microscopy; inter critical currents; intragranular critical currents; magnetic energy minimization; magnetization distribution; numerical simulations; tapes; Current distribution; Hall effect devices; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic susceptibility; Numerical simulation; Semiconductor process modeling; Transistors; Yttrium barium copper oxide; Ac susceptibility; Hall probe imaging; YBCO; grain boundaries; high-temperature superconductors;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2007.897985
Filename :
4278049
Link To Document :
بازگشت