An experimental study on improvement of performance for hemispherically shaped high-power IRED´s with Ga1-xAlxAs grown junctions

This paper describes the structure and performance of a high-power infrared emitting diode (IRED) designed as a high speed optical beam source for optoelectronic applications. The heterostructured junction is formed on a thick Ga1-xAlxAs liquid phase epitaxy (LPE) grown layer which is used to shape hemispherical emitting surfaces. Dislocation density in recombination region was considerably decreased by the thick layer growth on a GaAs wafer used as a primary substrate. Under dc operations, external quantum efficiencies of around 45 percent at a current density of 0.6 kA/cm²and about 110 mW of optical output power at 200 mA (1 kA/cm²) have been obtained from the diodes with a 160-µm junction diameter. The tendency to reach power saturation with increased current has been decreased by means of reducing of thermal resistance of the mount, and the diodes with 240- µm junction diameter have shown about 180 mW at 600 mA dc and 1.4 W at a 4-A pulse (60 Hz, 50 µs). A large improvement in high frequency response has been obtained and the bandwidth at -3-dB intensity has reached above 120 MHz.