DocumentCode :
1073753
Title :
High-resolution ΔE measurements of Fe-Si-B amorphous wire
Author :
Atkinson, D. ; Squire, P.T. ; Gibbs, M.R.J. ; Yamasaki, J.
Author_Institution :
Sch. of Phys., Bath Univ., UK
Volume :
29
Issue :
6
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
3478
Lastpage :
3480
Abstract :
The field dependence of Young´s modulus, E(H), of as-cast Fe-based amorphous wire has been investigated using a high resolution vibrating reed system. The E(H) data have been combined with DC M(H) loops and Kerr effect surface domain images to provide information about the effect of the large Barkhausen jump which characterizes the magnetization reversal in this material. At low fields the modulus decreases via an abrupt small step which correlates with the field at which the large Barkhausen jump occurs in the M(H) behavior. It is suggested that the reversal of the magnetization in the core domain leads to a slight rearrangement of domains in the sheath region of the wires. This is supported by the surface domain images and indicates a small asymmetry in the remanence states
Keywords :
Barkhausen effect; Kerr magneto-optical effect; Young´s modulus; amorphous state; boron alloys; ferromagnetic properties of substances; iron alloys; magnetic domains; magnetic properties of amorphous substances; magnetisation reversal; magnetoelastic effects; remanence; silicon alloys; Barkhausen jump; Fe-Si-B amorphous wire; Kerr effect surface domain images; Young´s modulus; as-cast Fe-based amorphous wire; asymmetry; core domain; field dependence; high resolution vibrating reed system; magnetization reversal; rearrangement; remanence states; sheath region; Amorphous magnetic materials; Amorphous materials; Magnetic anisotropy; Magnetic cores; Magnetic domains; Magnetic field measurement; Magnetostatics; Magnetostriction; Perpendicular magnetic anisotropy; Wire;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.281202
Filename :
281202
Link To Document :
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