DocumentCode :
1073789
Title :
GaSb Schottky diodes for infrared detectors
Author :
Nagao, Yasuyuki ; Hariu, Takashi ; Shibata, Yukio
Author_Institution :
Tohoku University, Sendai, Japan
Volume :
28
Issue :
4
fYear :
1981
fDate :
4/1/1981 12:00:00 AM
Firstpage :
407
Lastpage :
411
Abstract :
GaSb Schottky barrier photodiodes are shown to have quantum efficiency higher than 35 percent over a broad band of infra-red light wavelength shorter than 1.6 µm. Theoretical calculations of current voltage characteristics including tunneling current are compared with the experiment and it is suggested that surface leakage current, tunneling current, and avalanche breakdown, respectively, dominate the reverse characteristics with increasing voltage. Epitaxial growth of an n-type layer with carrier density 1015cm-3and suitable surface passivation are key technologies for the application of this material to infra-red detectors.
Keywords :
Avalanche breakdown; Breakdown voltage; Current-voltage characteristics; Epitaxial growth; Infrared detectors; Leakage current; Photodiodes; Schottky barriers; Schottky diodes; Tunneling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1981.20355
Filename :
1481507
Link To Document :
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