DocumentCode :
1073849
Title :
Domain wall pinning and hysteresis losses in amorphous CoNbZr films
Author :
Rouabhi, M. ; Guyot, M. ; Cagan, V. ; Krishnan, R.
Author_Institution :
Lab. de Magnetisme et Materiaux Magnetiques, CNRS, Meudon, France
Volume :
29
Issue :
6
fYear :
1993
fDate :
11/1/1993 12:00:00 AM
Firstpage :
3502
Lastpage :
3504
Abstract :
In a series of CoNbZr amorphous films prepared by RF sputtering, with thickness t ranging from 86 to 480 nm, the authors show that the domain wall (DW) motion is the dominant magnetization mechanism in the irreversible processes when the magnetic field is applied along the in-plane easy axis. A simple model, assuming a DW pinning at the film surfaces, explains the existence of a critical unpinning field (as well as hysteresis losses) inversely proportional to the film thickness. Frequency effects in loop parameters are reported up to 100 kHz
Keywords :
cobalt alloys; ferromagnetic properties of substances; magnetic domain walls; magnetic hysteresis; magnetic leakage; magnetic properties of amorphous substances; magnetic thin films; niobium alloys; sputtered coatings; zirconium alloys; 86 to 480 nm; CoNbZr amorphous films; critical unpinning field; domain wall motion; domain wall pinning; dominant magnetization mechanism; film surfaces; film thickness; hysteresis losses; in-plane easy axis; irreversible processes; loop parameters; magnetic field; radiofrequency sputtering; simple model; Amorphous magnetic materials; Amorphous materials; Frequency measurement; Loss measurement; Magnetic field measurement; Magnetic films; Magnetic hysteresis; Permeability; Saturation magnetization; Thickness measurement;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.281210
Filename :
281210
Link To Document :
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