• DocumentCode
    1073927
  • Title

    Observation of vertical Bloch lines using in-plane excitation fields

  • Author

    Theile, J. ; Engemann, J.

  • Author_Institution
    Dept. of Electr. Eng., Wuppertal Univ., West Germany
  • Volume
    24
  • Issue
    2
  • fYear
    1988
  • fDate
    3/1/1988 12:00:00 AM
  • Firstpage
    1781
  • Lastpage
    1783
  • Abstract
    To study the motion of vertical Bloch lines (VBL) in stripe domain walls in ferrimagnetic garnet films the experimental technique of using pulse in-plane fields has been applied. In addition the dynamics of VBLs, single and in a pair, have been examined in numerical simulations based on J. Slonczewski´s equations of wall motion (1982). In contrast to the commonly used domain-wall rocking method, wall parts having no VBLs affected by the excitation field are used, therefore giving a better detectability of VBLs. For detection purposes a sinusoidal AC in-plane field has been applied. For measuring dynamic properties of VBLs, single pulses of in-plane field with amplitudes up to 12 Oe and pulse widths varying from 200 ns to 2 mu s have been used. The velocity of VBLs, their mobility and their coercivity has been measured. The VBL velocity saturates at about 55 m/s. The measurements include overshoot. Simulations show large overshoots caused by the reduction of wall bending after pulse termination. High-speed photography during in-plane field pulsing reveals that the reduction in wall bending in real material is small.
  • Keywords
    coercive force; ferrimagnetic properties of substances; garnets; magnetic domain walls; magnetic thin films; coercivity; ferrimagnetic garnet films; high speed photography; in-plane fields; mobility; stripe domain walls; vertical Bloch lines; Coils; Conductors; Equations; Ferrimagnetic films; Garnet films; Numerical simulation; Optical pulses; Photography; Pulse measurements; Space vector pulse width modulation;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.11600
  • Filename
    11600