DocumentCode
1073943
Title
Virtual phase technology: A new approach to fabrication of large-area CCD´s
Author
Hynecek, Jaroslav
Author_Institution
Texas Instruments Incorporated, Dallas, TX
Volume
28
Issue
5
fYear
1981
fDate
5/1/1981 12:00:00 AM
Firstpage
483
Lastpage
489
Abstract
This article presents a new technology for fabrication of a single-phase CCD. This new technology called virtual phase (VP) employs only a single level gate structure, and is, therefore, ideally suited for fabrication of large-area high-performance devices with high yield, The fundamentals of operation of VP CCD´s are discussed, and the advantages and limitations of this new technology are presented. The design, fabrication, and operation of a 490 × 328 TV compatible VP imager is described, and performance parameters as well as imagery are presented.
Keywords
Charge coupled devices; Charge transfer; Clocks; Costs; Electrodes; Implants; Optical coupling; Optical device fabrication; Optical sensors; TV;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1981.20370
Filename
1481522
Link To Document