• DocumentCode
    1073943
  • Title

    Virtual phase technology: A new approach to fabrication of large-area CCD´s

  • Author

    Hynecek, Jaroslav

  • Author_Institution
    Texas Instruments Incorporated, Dallas, TX
  • Volume
    28
  • Issue
    5
  • fYear
    1981
  • fDate
    5/1/1981 12:00:00 AM
  • Firstpage
    483
  • Lastpage
    489
  • Abstract
    This article presents a new technology for fabrication of a single-phase CCD. This new technology called virtual phase (VP) employs only a single level gate structure, and is, therefore, ideally suited for fabrication of large-area high-performance devices with high yield, The fundamentals of operation of VP CCD´s are discussed, and the advantages and limitations of this new technology are presented. The design, fabrication, and operation of a 490 × 328 TV compatible VP imager is described, and performance parameters as well as imagery are presented.
  • Keywords
    Charge coupled devices; Charge transfer; Clocks; Costs; Electrodes; Implants; Optical coupling; Optical device fabrication; Optical sensors; TV;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1981.20370
  • Filename
    1481522